Anisotropic deformation behaviour of GaAsHÖCHE, H.-R; SCHREIBER, J.Physica status solidi. A. Applied research. 1984, Vol 86, Num 1, pp 229-236, issn 0031-8965Article

Transformation of the angular-dependent form of X-ray diffraction into the photon-energy-dependent form for grazing incidenceHÖCHE, H. R; NIEBER, J.Physica status solidi. A. Applied research. 1988, Vol 108, Num 2, pp 489-493, issn 0031-8965Article

X-ray Bragg diffraction with asymmetric and skew geometriesHÖCHE, H.-R; HÖFER, H.Physica status solidi. A. Applied research. 1992, Vol 134, Num 1, pp 87-92, issn 0031-8965Article

Lithium fluoride transmission phase-retarder for X-raysLEITENBERGER, W; EISENSCHMIDT, C; HÖCHE, H.-R et al.Journal of applied crystallography. 1997, Vol 30, pp 164-170, issn 0021-8898, 2Article

Extremely skew X-ray diffractionHÖCHE, H. R; BRÜMMER, O; NIEBER, J et al.Acta crystallographica. Section A, Foundations of crystallography. 1986, Vol 42, Num 6, pp 585-587, issn 0108-7673Article

Change of the X-ray polarisation state by diffractionHÖCHE, H.-R; KOLBE, M; EISENSCHMIDT, Ch et al.Crystal research and technology (1979). 2002, Vol 37, Num 7, pp 665-675, issn 0232-1300Article

Position-resolved measurement of the polarization state in the forward-diffracted X-ray beamLEITENBERGER, W; EISENSCHMIDT, C; HÖCHE, H.-R et al.Acta crystallographica. Section A, Foundations of crystallography. 1996, Vol 52, pp 621-628, issn 0108-7673, 4Article

Line defects in A^IIIB^V semiconductorsHÖCHE, H.-R; LEIPNER, H. S; STADERMANN, G et al.Physica status solidi. A. Applied research. 1986, Vol 98, Num 2, pp 503-510, issn 0031-8965Article

Line defects in A^IIIB^V semiconductorsHÖCHE, H.-R; LEIPNER, H. S; STADERMANN, G et al.Physica status solidi. A. Applied research. 1986, Vol 98, Num 2, pp 503-510, issn 0031-8965Article

Modification of specularly reflected X-ray intensity by grazing incidence coplanar Bragg-case diffractionHÖCHE, H.-R; NIEBER, J; CLAUSNITZER, M et al.Physica status solidi. A. Applied research. 1988, Vol 105, Num 1, pp 53-60, issn 0031-8965Article

Imaging of the energy flow in the three-beam case of x-ray diffractionHEYROTH, F; HÖCHE, H.-R; EISENSCHMIDT, C et al.Journal of physics. D, Applied physics (Print). 1999, Vol 32, Num 10A, pp A133-A138, issn 0022-3727Article

Pinhole topography in the three-beam case of x-ray diffraction: experiment and theoryHEYROTH, F; ZELLNER, J; HÖCHE, H-R et al.Journal of physics. D, Applied physics (Print). 2001, Vol 34, Num 10A, pp A151-A157, issn 0022-3727Article

Measurement and correction of secondary extinction in CaF₂ by means of synchroton X-ray diffraction dataHOCHE, H. R; SCHULZ, H; WEBER, H.-P et al.Acta crystallographica. Section A, Foundations of crystallography. 1986, Vol 42, Num 2, pp 106-110, issn 0108-7673Article